Failure Mechanisms of Cvd Diamond Wafers and Thin Films During Polishing

Yiqing Chen,Weidong Liu,Haibo Feng,Liangchi Zhang
DOI: https://doi.org/10.1080/10910344.2014.991030
2015-01-01
Machining Science and Technology
Abstract:This article investigates the failure mechanisms of CVD diamond wafers and thin films during a fast dynamic friction polishing process. To explore the evolution of temperature and stress fields, a comprehensive finite element analysis was systematically carried out, with the aid of experimental examination. It was found that the discontinuity and sharp change of the stresses across the film-substrate interface causes debonding failure of a CVD diamond thin film specimen. In the case of a CVD diamond wafer, however, the high surface tensile stress and bulk bending is responsible for the cracking. It was concluded that specimen cracking is sensitive to the polishing pressure, and that the polishing window for the CVD thin films is smaller. Polishing time is a critical factor, because a longer time corresponds to a higher thermal stress. This article points out that using the combination of a smaller polishing load and a greater sliding speed is a good option in selecting polishing parameters. To minimize cracking, a stepwise polishing process can be used. With the proper parameters obtained in this study, very smooth, high-quality surfaces of CVD diamond wafers and thin films can be produced in a short polishing duration of minutes.
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