A Novel Double Trench Reverse Conducting IGBT with Robust Freewheeling Switch

Zhu Liheng,Chen Xingbi
DOI: https://doi.org/10.1088/1674-4926/35/8/084004
2014-01-01
Abstract:The phenomenon that the wide P-emitter region in the conventional reverse conducting insulated gate bipolar transistor (RC-IGBT) results in the non-uniform current distribution in the integrated freewheeling diode (FWD), and then causes a parasitic thyristor to latch-up during its reverse-recovery process, which induces a hot spot in the local region of the device is revealed for the first time. Furthermore, a novel RC-IGBT based on double trench IGBT is proposed. It not only solves the snapback problem but also has uniform current distribution and high ruggedness during the reverse-recovery process.
What problem does this paper attempt to address?