Microwave dielectric properties of CaV 2 O 6 ceramics with low dielectric loss

Guo-Guang Yao,Cui-Jin Pei,Jian-Gang Xu,Peng Liu,Jian-Ping Zhou,Huai-Wu Zhang

DOI: https://doi.org/10.1007/s10854-015-3414-4

2015-01-01

Abstract:Novel glass-free low temperature firing microwave dielectric ceramics CaV 2 O 6 with high Q was prepared through a conventional solid-state reaction method. The crystal phase and microstructures were studied by XRD and SEM. Orientation degree of CaV 2 O 6 ceramics increased with an increase of sintering temperature. The Qxf values of CaV 2 O 6 ceramics were strongly correlated with the densification and orientation degree. Typically, the CaV 2 O 6 ceramics sintered at 675 °C possessed excellent microwave dielectric properties: ε r = 10.2, Qxf = 123,000 GHz (at 10.2 GHz) and τ f = −60 ppm/°C.