Ultra Low Loss (mg1 − Xcax)2sio4dielectric Ceramics (x = 0 to 0.15) for Millimeter Wave Applications

Iqra Hameed,Lei Li,Xiao Qiang Liu,Xiang Ming Chen
DOI: https://doi.org/10.1111/jace.18171
IF: 4.186
2021-01-01
Journal of the American Ceramic Society
Abstract:(Mg1 - xCax)(2)SiO4 dense ceramics (x >= 0.15) were prepared, and their microwave dielectric characteristics were investigated together with the structure evolution. The sintering temperature for Mg2SiO4 ceramics was reduced significantly with Ca(2+)substitution. (Mg1 - xCax)(2)SiO4 ceramics exhibited a small increase in dielectric constant (epsilon(r)) correlated with increased crystallite size, and ultra-high quality factor Qf value was achieved throughout the compositional range. Temperature coefficient of resonant frequency (tau(f)) was considerably tuned from -70 ppm/degrees C to -33 ppm/degrees C, and this improvement was deeply linked with the decreased bond valance. At x = 0.075, (Mg1 - xCax)(2)SiO4 ceramics exhibited the best combination of microwave dielectric characteristics: epsilon(r )= 7.2, Qf = 199,800 GHz at 26 GHz, tau(f )= -33 ppm/degrees C. The present ceramics could be expected as promising candidate of dielectric materials for millimeter wave applications.
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