Ultrabroad‐Spectrum Photodetectors: Multimechanism Synergistic Photodetectors with Ultrabroad Spectrum Response from 375 Nm to 10 Μm (adv. Sci. 15/2019)
Xudong Wang,Hong Shen,Yan Chen,Guangjian Wu,Peng Wang,Hui Xia,Tie Lin,Peng Zhou,Weida Hu,Xiangjian Meng,Junhao Chu,Jianlu Wang
DOI: https://doi.org/10.1002/advs.201970089
IF: 15.1
2019-01-01
Advanced Science
Abstract:Advanced ScienceVolume 6, Issue 15 1970089 Inside Front CoverOpen Access Ultrabroad-Spectrum Photodetectors: Multimechanism Synergistic Photodetectors with Ultrabroad Spectrum Response from 375 nm to 10 µm (Adv. Sci. 15/2019) Xudong Wang, Xudong Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorHong Shen, Hong Shen State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorYan Chen, Yan Chen State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 China University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049 ChinaSearch for more papers by this authorGuangjian Wu, Guangjian Wu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorPeng Wang, Peng Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorHui Xia, Hui Xia State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorTie Lin, Tie Lin State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorPeng Zhou, Peng Zhou Department of Microelectronics, State Key Laboratory of ASIC and System, Fudan University, Shanghai, 200433 ChinaSearch for more papers by this authorWeida Hu, Weida Hu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorXiangjian Meng, Xiangjian Meng State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorJunhao Chu, Junhao Chu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorJianlu Wang, Jianlu Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this author Xudong Wang, Xudong Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorHong Shen, Hong Shen State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorYan Chen, Yan Chen State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 China University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049 ChinaSearch for more papers by this authorGuangjian Wu, Guangjian Wu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorPeng Wang, Peng Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorHui Xia, Hui Xia State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorTie Lin, Tie Lin State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorPeng Zhou, Peng Zhou Department of Microelectronics, State Key Laboratory of ASIC and System, Fudan University, Shanghai, 200433 ChinaSearch for more papers by this authorWeida Hu, Weida Hu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorXiangjian Meng, Xiangjian Meng State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorJunhao Chu, Junhao Chu State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this authorJianlu Wang, Jianlu Wang State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083 ChinaSearch for more papers by this author First published: 07 August 2019 https://doi.org/10.1002/advs.201970089AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract In article number 1901050, Jianlu Wang, Weida Hu, and co-workers develop a type of photodetector with ultrabroad spectrum response from 375 nm to 10 µm. With the synergism of multi-mechanisms in atomic-layered semiconductor and quasi-freestanding organic ferroelectric films, such as low-dimensional structure, photoconductivity, pyroelectricity, and ferroelectricity, this photodetector can sensitively respond to light continuously from ultraviolet to long-wavelength infrared. Volume6, Issue15August 7, 20191970089 RelatedInformation