XAFS and XRD Studies of the Cd1-xZnxTe Crystal Fine Structure

Feng Tao,Zha Gangqiang,Yang Jian,Li Jiong,Jiang Zheng,Xu Lingyan,Wang Tao,Jie Wanqi
DOI: https://doi.org/10.1088/1742-6596/430/1/012087
2013-01-01
Journal of Physics Conference Series
Abstract:Cd1-xZnxTe crystal is a new kind of room temperature semiconductor radiation detector material developed in recent years. Cd1-xZnxTe is zinc-blende structure, which is similar to CdTe, but the fine structure of Cd1-xZnxTe ternary compound semiconductor is different from CdTe and ZnTe binary compound semiconductors. In this contribution, the fine structure of Cd1-xZnxTe has been studied by the synchrotron radiation X-ray absorption fine structure (XAFS) technology and X-ray diffraction (XRD) technology. The K-edges XAFS spectra of cadmium, zinc and tellurium in Cd1-xZnxTe have been obtained, and the differences between the structures of binary and ternary compound crystals have also been analyzed. The Fourier transform of the k(2)-weighted absorption spectra prove that Zn atoms occupy the position of the Cd atoms. The bond lengths of Cd1-xZnxTe have also been obtained by extended X-ray absorption fine structure (EXAFS), and the results imply that the local atomic structure of Cd1-xZnxTe is distorted. The doping of Zn in the structure contributes to the distortion, which should be responsible for the different properties in Cd1-xZnxTe. Normalized X-ray absorption near-edge structure (XANES) spectra on Cd K-edge, Zn K-edge and Te K-edge in CdTe, Cd0.96Zn0.04Te, Cd0.9Zn0.1Te and ZnTe are also shown.
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