Abstract:Measuring the internal quality factor of coplanar waveguide superconducting resonators is an established method of determining small losses in superconducting devices. Traditionally, the resonator losses are only attributed to two-level system (TLS) defects using a power dependent model for the quality factor. However, excess non-equilibrium quasiparticles can also limit the quality factor of the planar superconducting resonators used in circuit quantum electrodynamics. At millikelvin temperatures, quasiparticles can be generated by breaking Cooper pairs via a single high-energy or multiple sub-gap photons. Here a two-temperature, power and temperature dependent model is proposed to evaluate resonator losses for isolating TLS and quasiparticle loss simultaneously. The model combines the conventional TLS power and temperature dependence with an effective temperature non-equilibrium quasiparticle description of the superconducting loss. The quasiparticle description is based on the quasiparticle number density calculated using rate equations for an external quasiparticle generation source, recombination, and trapping. The number density is translated to an effective temperature using a thermal distribution that may be different from the bath. Experimental measurements of high-quality factor resonators fabricated from single crystal aluminum and titanium nitride thin films on silicon are interpreted with the presented model. This approach enables identification of quasiparticle and TLS loss, resulting in the determination that the TiN resonator has comparable TLS and quasiparticle loss at low power and low-temperature, while the low-temperature Al resonator behavior is dominated by non-equilibrium quasiparticle loss.

Measurement of Quality Factor and Losses in Superconducting Microwave Resonator Integrated with Nbn/Aln/Nbn Qubit Circuit

Improving the Coherence Time of Superconducting Coplanar Resonators

Substrate and process dependent losses in superconducting thin film resonators

Materials loss measurements using superconducting microwave resonators

Measuring the Quality Factor of a Microwave Cavity Using Superconducting Qubit Devices

Loss Dependence on Geometry and Applied Power in Superconducting Coplanar Resonators

Determining interface dielectric losses in superconducting coplanar waveguide resonators

High-Q trenched aluminum coplanar resonators with an ultrasonic edge microcutting for superconducting quantum devices

Resolving the positions of defects in superconducting quantum bits

Identification and Mitigation of Conducting Package Losses for Quantum Superconducting Devices

Microscopic relaxation channels in materials for superconducting qubits

Direct Measurement of Microwave Loss in Nb Films for Superconducting Qubits

Wiring surface loss of a superconducting transmon qubit

Analysis and mitigation of interface losses in trenched superconducting coplanar waveguide resonators

Characterizing losses in InAs two-dimensional electron gas-based gatemon qubits

Power and temperature dependent model for High Q superconductors

Characterizing Niobium Nitride Superconducting Microwave Coplanar Waveguide Resonator Array for Circuit Quantum Electrodynamics in Extreme Conditions

Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators

Simulating noise on a quantum processor: interactions between a qubit and resonant two-level system bath

Geometric Scaling of Two-Level-System Loss in Superconducting Resonators