Residual Stress Generation During Constrained Sintering of Layered Ceramic Thin Film Structures

Busso E. P.,Travis R. P.,Chandra L.
DOI: https://doi.org/10.1557/proc-505-547
1997-01-01
MRS Proceedings
Abstract:This work investigates the sintering kinetics and residual stresses which develop in thin layered ceramic structures when sintered on a rigid substrate. A continuum constitutive framework to model the evolution of the microstructure and stresses in the sintering layers under non-isothermal conditions is presented. The sintering model is used to investigate the constrained sintering behaviour of layered ceramic structures used in solid oxide fuel cells (SOFC). Samples of a 50 μm thick SOFC film were screen-printed on a fully dense yttriastabilised zirconia substrate and then sintered at temperatures ranging from 1100°C to 1300°C. Measured values of relative density and average grain size are compared with model predictions. A correlation between residual stresses extracted from curvature measurements and analytical predictions revealed these stresses to have been mostly relieved during the subsequent cooling by microcrack formation.
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