Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Multi-channel Analyzer/detector System for High-Speed, High-Resolution Powder Diffraction

Discrete Averaging of X‐Ray Diffraction Data Using a Multichannel Analyzer

Combining a multi-analyzer stage with a two-dimensional detector for high-resolution powder X-ray diffraction: correcting the angular scale

Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument

High-Throughput Powder Diffraction Using White X-Ray Beam and a Simulated Energy-Dispersive Array Detector

A 4-channel multiplex analyzer for real-time, parallel processing of fast scintillators

New Synchrotron Powder Diffraction Facility for Long-Duration Experiments

High energy electron diffraction instrument with tunable camera length

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

A Multi-Channel Device For Scintillation Crystal Testing

High-Throughput X-Ray Characterization System For Combinatorial Materials Studies

Electronic angle focusing for neutron time‐of‐flight powder diffractometers

Precision Mechanical Design Of An Ultrahigh-Resolution Inelastic X-Ray Scattering Spectrometer System With Cdfdw Optics At The Aps

One-dimensional Parallax-Free Position-Sensitive Detector for Diffraction Measurements Based on a Home-Made Thin THGEM.

Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: Application to pair distribution function analysis.

Serial Chemical Crystallography for Autonomous Quantitative Phase Analysis in an Electron Microscope

Design of handheld 500-MHz digital multi-channel analyzer on single board

High-speed X-ray Diffraction for Studying Irreversible Materials Structure Dynamics

Mythen detector for X-ray diffraction at the Beijing synchrotron radiation facility

Demonstration of neutron time-of-flight diffraction with an event-mode imaging detector

Data Acquisition in Powder X-ray Diffraction Measurements Using an Area Detector