High-Pressure Energy-Dispersive X-Ray-Diffraction Technique With Synchrotron-Radiation

J Hu,Hk Mao,Jf Shu,Rj Hemley
DOI: https://doi.org/10.1063/1.46138
1994-01-01
AIP Conference Proceedings
Abstract:An energy dispersive x‐ray diffraction technique employing superconducting wiggler synchrotron radiation for high‐pressure research is described. The incident beam is controlled by a double slit system capable of producing uniform beam sizes of 5 to 10 μm impinging on diamond‐anvil cell samples. Alignment of the incident beam, sample, and diffracted beam is achieved by an automated θ−2θ system with positional accuracy of 0.001 mm and angle accuracy of 0.001°. Internal x‐ray standards and ruby fluorescence are used for pressure measurement. Crystal structures, equations of state, and phase transitions of polycrystalline and single‐crystal samples to multimegabar pressure and at temperatures of 50 to 1100 K have been studied.
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