Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Energy dispersive x-ray diffraction of charge density waves via chemical filtering

Two-dimensional Energy Dispersive X-Ray Diffraction at High Pressures and Temperatures

High-Pressure Energy-Dispersive X-Ray-Diffraction Technique With Synchrotron-Radiation

Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures

Adapting polychromatic X-ray microdiffraction techniques to high-pressure research: energy scan approach.

Confirmation of the Structural Phase Transitions in Xef2 under High Pressure

Brillouin Scattering Spectroscopy for A Laser Heated Diamond Anvil Cell

A Focusing System for X-ray Diffraction Studies of Materials under High Pressure in the Diamond Cell

High-Pressure and High-Temperature Powder Diffraction

Tracking structural phase transitions via single crystal x-ray diffraction at extreme conditions: advantages of extremely brilliant source

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Coherent diffraction imaging of nanoscale strain evolution in a single crystal under high pressure

Large volume high pressure research using the wiggler port at NSLS

HIGH-PRESSURE SYNCHROTRON X-RAY DIFFRACTION OF CS IV AND CS V

Electronic and magnetic studies of materials to megabar pressures

Conceptual Density Functional Theory under Pressure: Part I. XP-PCM Method Applied to Atoms

Synchrotron X-ray powder diffraction under high pressures up to 33 MPa for mechanoresponsive materials

A Scanning Angle Energy-Dispersive X-Ray Diffraction Technique for High-Pressure Structure Studies in Diamond Anvil Cells

Invited article: High-pressure techniques for condensed matter physics at low temperature

Patterned Diamond Anvils Prepared Via Laser Writing for Electrical Transport Measurements of Thin Quantum Materials under Pressure

Focusing Polycapillary To Reduce Parasitic Scattering For Inelastic X-Ray Measurements At High Pressure