APPLICATION OF SYNCHROTRON RADIATION TO HIGH PRESSURE X-RAY DIFFRACTION

P. Hatton
DOI: https://doi.org/10.1051/JPHYSCOL:1984864
1984-11-01
Abstract:- The availability of dedicated, high brightness synchrotron radia tion sources is leading to many improvements in x-ray diffraction techniques. In addition to the widely discussed polychromatic energy dispersive tech niques, significant advances can be made by the use of monochromatic radiation in either angle- or wavelength-scanning. The application of these techniques, being developed at Daresbury, for high pressure investigations is outlined. The availability of synchrotron radiation has provided considerable advances in high pressure x-ray diffraction. Synchrotron radiation sources yield a smooth con tinuum of electromagnetic radiation from x-ray to far-infrared wavelengths. The radiation can be shifted towards shorter wavelengths by utilising insertion devices such as wigglers. The SRS wiggler has a critical wavelength X = 0.93 A and the useful radiation extends to 0.2 A. Synchrotron radiation is of very high intensity, is highly collimated and is polarized in the plane of the ring. These desirable characteristics may be exploited for x-ray diffraction work with samples under high pressures in diamond anvil cells (d.a.c's).
Chemistry,Physics
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