Physical Origin of Data Pattern Inversion in Optical Injection-Locked VCSELs

weijian yang,peng guo,devang parekh,w hofmann,m c amann,connie j changhasnain
DOI: https://doi.org/10.1364/FIO.2009.FTuW2
2009-01-01
Abstract:The physical origin and criteria for adjustable data pattern inversion in optical injection locked VCSELs are explained with a novel model including the interference effect of master laser reflection. Simulation results agree well with experiments.
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