Optical Microscopy and Spectroscopy Beyond the Diffraction Limit

L Novotny,EJ Sanchez,XS Xie
DOI: https://doi.org/10.1117/12.306128
1998-01-01
Abstract:A new approach to near-field optical microscopy is presented. The method relies on the highly enhanced fields at sharp metal tips under proper laser illumination. These fields are laterally confined to the tip size and can be used to locally excite the sample surface. Detection of nonlinear responses (two-photon fluorescence, generation of second/third harmonics) ensure sufficient background discrimination. The strong field gradients close to the tip give also rise to a trapping force towards the tip. Therefore, the proposed scheme is also promising for optical trapping and alignment of dielectric particles in aqueous environments at the nanometer scale. The paper presents the results of self-consistent three-dimensional field calculations. Starting with a discussion of commonly used aperture probes, the field distributions for the never scheme are presented.
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