Abstract:We present three-dimensional simulations of the image formation of microstructure in near-field optical microscopy with the three-dimensional finite-difference time-domain method (FDTD). First, we calculated the intensity distributions inside and outside and the flux densities for both the tapered and parabolic fiber probes used in near-field optical microscope and nanolithography. The calculating result shows that for different kinds of shape the intensity distributions in both probes are similar and present standing wave forms; but the amplitudes and locations of peaks of the standing waves are different from each other. The intensity outward parabolic probe is higher than that outward tapered probe. Then we computed the intensity distributions of the samples which are composed of different materials by different polarization illumination. Assuming an aperture-type probe in collection-mode near-field microscope, we compare the images produced from the sample composed of three dielectric blocks in nanometer at a distance of 25nm and 150nm, respectively, under constant-high-scanning mode along with the direction of the polarization of the illuminating light, with near-field distribution of the sample without probe. The results show that the probe disturbs the original field distribution of the sample. The received signal is different from the original field distribution of the sample. However the received signal contains high frequency information of the sample in near-field region. Due to probe-sample interaction, parts of evanescent field transform into propagation wave. Only the interaction between the probe and sample in the near field makes possible to probe the high-frequency components and achieve the super-resolution. Therefore, the detected resolution depends on an assembly of the tip size, shape of the tip, distance between tip and sample, relative position and material characteristics of both tip and sample. These results provide the basis for correct interpretation of experimental work.

Near-field Nonlinear Imaging of an Anapole Mode Beyond Diffraction Limit.

Far-field Optical Nanoscopy Via Visible Light

High Contrast Wide-Field Evanescent Wave Illuminated Sub-Diffraction Imaging (conference Presentation)

Near-Field Subwavelength Imaging in Wave-Like Two-Dimensional Photonic Crystal

Strong Nonlinear Optics In On-Chip Coupled Lithium Niobate Microdisk Photonic Molecules

Near-field imaging beyond the probe aperture limit

Near-field imaging of photonic spin-orbit interactions and optical nonlinear effects in nanostructures

Optical Microscopy and Spectroscopy Beyond the Diffraction Limit

Harmonic Imaging Through Nonlinear Metamaterial Surfaces

Anapole mediated giant photothermal nonlinearity in nanostructured silicon

Quantitative Imaging of Rapidly Decaying Evanescent Fields Using Plasmonic Near-Field Scanning Optical Microscopy

Imaging the field inside nanophotonic devices

Cylindrical Vector Beam Revealing Multipolar Nonlinear Scattering for Superlocalization of Silicon Nanostructures

Probing and Imaging Vectorial Optical Field by Heterodyne Near-field Microscopy and Nanopolarimetry

Study on Near-Field Optical Imaging Mechanism

Nanoscale Visualization of a Photoinduced Plasmonic Near-Field in a Single Nanowire by Free Electrons

Few photons probe third-order nonlinear properties of nanomaterials in a plasmonic nanocavity

Quasinormal-mode modeling and design in nonlinear nano-optics

Nonlinear Optical Radiation of a Lithium Niobate Microcavity

Detection of optical field by near-field scanning optical microscopy

Optical Anapole Mode in Nanostructured Lithium Niobate for Enhancing Second Harmonic Generation