Surface Profile Measurement Using Chromatic Confocal Microscopy

KB Shi,P Li,SZ Yin,ZW Liu
DOI: https://doi.org/10.1117/12.571595
2004-01-01
Abstract:We investigate lateral and axial chromatic confocal microscopy using supercontinuum white light, and its application to surface profile measurement. In the systems that we describe here, the lateral or the axial scanning is effectively realized by focusing different wavelengths of the supercontinuum to either different lateral or axial positions through purposely introduced chromatic dispersion and aberration respectively. As a result, the imaging speed can be greatly improved. We use this system to demonstrate the surface profile measurement of a microcircuit chip, with a sensitivity of 8.5 nm and a depth measurement range of about 7 microns.
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