Sensing Nanometric Displacement of a Micro-/Nano-fiber Induced by Optical Forces by Use of White Light Interferometry

Weiqia Qiu,Hankai Huang,Jianhui Yu,Huazhuo Dong,Zhe Chen,Huihui Lu
DOI: https://doi.org/10.1117/12.2184393
2015-01-01
Abstract:Sensing the nanometric displacement of a micro-/nano-fiber induced by optical forces is a key technology to study optical forces and optical momentum. When the gap between a micro-/nano-fiber and glass substrate becomes down to micrometer scale or less, a white light interference was observed. The gap changes when optical force arising from the propagating pump light along the micro-/nano-fiber causes a transversal nanometric displacement of a micro-/nano-fiber, resulting in movement of the interferometric fringes. Therefore this movement of the interferometric fringes can be used to sense the nanometric displacement of the micro-/nano-fiber induced by optical forces. Experimental results show that the resolutions of this method can reach 7.27nm/pixel for tilted angle 0.8 degrees between the micro-/nano-fiber and substrate. It is concluded that the white light interferometry method is suitable for measuring the weak optical force.
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