A Traceable Nanometre Sensor Based on FP Feedback Cavity

zhaoli zeng,shulian zhang
DOI: https://doi.org/10.1007/978-3-642-36359-7_142
2014-01-01
Abstract:Nanometer traceability has been of great concern and no solution for long time [1-5]. The conventional laser interferometer is able to measure displacement very precisely when the displacement is more than half wavelength. The measurement result is nλ/2. The n is the sum of whole numbers of light interference fringes. The decimal fraction of light interference fringes is obtained by using electric subdivision method which may give rise to errors [6-7]. So, we are in doubt as we say how many nanometers displacement smaller than half wavelength due to the electrical division result not a nature benchmark in laser interferometers [8-9]. The X-ray interferometer provides the means for linear subdivision of light fringes in accordance with the lattice parameter of silicon [10-11]. However, the combined optical and X-ray interferometer (COXI) makes the system too complicated and expensive to use in practice widely [12-13].
What problem does this paper attempt to address?