Reduction of the Efficiency Droop in Silicon Nitride Light-Emitting Devices by Localized Surface Plasmons

Feng Wang,Dongsheng Li,Lu Jin,Deren Yang,Duanlin Que
DOI: https://doi.org/10.1063/1.4793757
IF: 4
2013-01-01
Applied Physics Letters
Abstract:The external quantum efficiency as well as its degeneration in silicon nitride light-emitting devices is significantly improved by the addition of metal nanostructures. The origin of this efficiency droop phenomenon is investigated in detail via the analysis of the dominant process contributing to the light output power and the carrier injection conditions for the devices with and without metal nanostructures. We attribute this droop mainly to the nonradiative Auger recombination as the introduction of metal nanostructures would suppress the Auger process but make the carrier overflow more serious due to the enhanced local electrical field by localized surface plasmon resonance.
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