Electrically Pumped Random Lasing from the Light-Emitting Device Based on Two-Fold-Tandem Sio2/Zno Structure

Yunpeng Li,Canxing Wang,Lu Jin,Xiangyang Ma,Deren Yang
DOI: https://doi.org/10.1063/1.4803020
IF: 4
2013-01-01
Applied Physics Letters
Abstract:We report on remarkable decrease in threshold current for electrically pumped random lasing (RL) from the light-emitting device based on two-fold-tandem (double-) SiO2/ZnO-structure with respect to that in the case of single-SiO2/ZnO-structured device. Moreover, the former is of higher power conversion efficiency. In the double-SiO2/ZnO-structure, a waveguide is formed by the stacking SiO2/ZnO/SiO2, which enables photon confinement. Moreover, the electrons leaking out of the bottom SiO2/ZnO-structure are collected and partly involved in the radiative recombination in the top one. Furthermore, the RL photons generated in the bottom SiO2/ZnO-structure act as the stimuli to increase the stimulated emission rate in the top one. For the above-mentioned reasons, the RL performance of the double-SiO2/ZnO-structured device is substantially improved.
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