Synchrotron X-Ray Nano-Tomography Characterization Of The Sintering Of Multilayered Systems

zilin yan,olivier guillon,steve wang,christophe l martin,chulseung lee,didier bouvard
DOI: https://doi.org/10.1063/1.4730625
IF: 4
2012-01-01
Applied Physics Letters
Abstract:Synchrotron x-ray nano-tomography was used to characterize the microstructures of multi-layer ceramic capacitors before and after sintering. 3D microstructures of the same sample were reconstructed and quantitatively analyzed. The discontinuities observed in inner electrodes were found to originate from initial heterogeneities of nickel powders in the electrodes. They are supposed to grow due to the constraint of adjacent dielectric layers. Dielectric layers show anisotropic shrinkage with a decrease in density as function of layer position in the multilayer. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4730625]
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