Interface Structures in MgB2 Thin Films on (0001) SiC

JS Wu,N Jiang,B Jiang,JCH Spence,AV Pogrebnyakov,JM Redwing,XX Xi
DOI: https://doi.org/10.1063/1.1779338
IF: 4
2004-01-01
Applied Physics Letters
Abstract:The structure of the MgB2∕SiC interface has been studied by high-resolution electron microscopy. Most of the defects at the interface are dislocations with Burgers vector [0001]. In addition, a minority of dislocations with Burgers vector [112¯0]∕3 are also generated to relax the mismatch stress between film and substrate. Energy loss spectra obtained from nanometer regions show that the interface is not affected by oxygen.
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