Enhancing the Ph Sensitivity by Laterally Synergic Modulation in Dual-Gate Electric-Double-Layer Transistors

Ning Liu,Yang Hui Liu,Ping Feng,Li Qiang Zhu,Yi Shi,Qing Wan
DOI: https://doi.org/10.1063/1.4913445
IF: 4
2015-01-01
Applied Physics Letters
Abstract:The sensitivity of a standard ion-sensitive field-effect transistor is limited to be 59.2 mV/pH (Nernst limit) at room temperature. Here, a concept based on laterally synergic electric-double-layer (EDL) modulation is proposed in order to overcome the Nernst limit. Indium-zinc-oxide EDL transistors with two laterally coupled gates are fabricated, and the synergic modulation behaviors of the two asymmetric gates are investigated. A high sensitivity of ∼168 mV/pH is realized in the dual-gate operation mode. Laterally synergic modulation in oxide-based EDL transistors is interesting for high-performance bio-chemical sensors.
What problem does this paper attempt to address?