What Has Been Measured by Reflection Magnetic Circular Dichroism in Ga1-Xmnxas/Gaas Structures?

He Zhen-Xin,Zheng Hou-Zhi,Huang Xue-Jiao,Wang Hai-Long,Zhao Jian-Hua
DOI: https://doi.org/10.1088/1674-1056/23/7/077801
2014-01-01
Chinese Physics B
Abstract:An explicit expression of reflection magnetic circular dichroism (R-MCD) has been derived, taking into account the interference effect that arises from multiple internal reflections in an air/Ga1-xMnxAs/GaAs dielectric layered system. It unambiguously shows that the R-MCD signal is composed by three terms. In addition to the conventional term, which is sufficient in the absence of interference, an oscillatory term is required. Both of them are related to the imaginary part epsilon(xy)'' of the off-diagonal element of the dielectric tensor. One also becomes aware that in this case R-MCD is not actually determined only by the imaginary part epsilon(xy)'' of the off-diagonal element of the dielectric tensor, as has been widely accepted. In fact, the real part epsilon(xy)' of the off-diagonal element will substantially mix into the measured R-MCD results by another oscillatory cos theta form. It can even reverse the sign of R-MCD, when the Ga1-xMnxAs layer becomes thicker. The main aspects of these predictions were used to reasonably explain the R-MCD results measured in three different types of samples. Our work will bring about a reconsideration of how to correctly explain R-MCD results.
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