A Closed-Form Capacitance Model For Tunnel Fets With Explicit Surface Potential Solutions

jiaxin wang,chunlei wu,qianqian huang,chao wang,ru huang
DOI: https://doi.org/10.1063/1.4894624
IF: 2.877
2014-01-01
Journal of Applied Physics
Abstract:In this paper, a closed-form physical capacitance model for bulk tunnel FETs (TFETs) is proposed based on the surface potential approach for the first time. Fundamentally different from that in the MOSFET, the channel surface potential phi(sf) in the TFET is alternately controlled by the drain bias and gate bias in different operation regions. On the basis of physical insight into the operation mechanism, the analytical model of phi(sf) as a function of terminal bias is established. The Gaussian box is introduced to predict the surface potential profile near the source-body junction. Furthermore, the surface-potential-based capacitance model is derived and the calculated terminal capacitances show good agreement with the TCAD simulation results. With the essential physics considered, excellent validity of the model is achieved for bulk TFETs with a large range of structure parameters and SOI/double-gate (DG) TFETs. (C) 2014 AIP Publishing LLC.
What problem does this paper attempt to address?