Conservative Antiphase Boundary in Srtio3 Films on Laalo3 Substrates with Srruo3 Buffer Layers

JS Wu,CL Jia,K Urban,JH Hao,XX Xi
DOI: https://doi.org/10.1063/1.1367881
IF: 2.877
2001-01-01
Journal of Applied Physics
Abstract:We have studied the microstructure of SrTiO3 films on LaAlO3 substrates with the SrRuO3 buffer layer using high-resolution transmission electron microscopy. While high density of defects due to lattice mismatch were found at the SrRuO3/LaAlO3 interface, no misfit dislocation was observed at the SrTiO3/SrRuO3 interface. The {111} stacking fault in the SrRuO3 buffer layer propagates into the SrTiO3 film, giving rise to a type of antiphase boundary on the {110} plane with a crystallographic shear vector of a/2〈001〉. The boundary is a conservative one which does not lead to any charge defects. A model based on dislocation interactions is proposed to explain the generation mechanism of the antiphase boundary.
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