Polarization-sensitive Interferometric Synthetic Aperture Microscopy.

Fredrick A. South,Yuan-Zhi Liu,Yang Xu,Nathan D. Shemonski,P. Scott Carney,Stephen A. Boppart
DOI: https://doi.org/10.1063/1.4936236
IF: 4
2015-01-01
Applied Physics Letters
Abstract:Three-dimensional optical microscopy suffers from the well-known compromise between transverse resolution and depth-of-field. This is true for both structural imaging methods and their functional extensions. Interferometric synthetic aperture microscopy (ISAM) is a solution to the 3D coherent microscopy inverse problem that provides depth-independent transverse resolution. We demonstrate the extension of ISAM to polarization sensitive imaging, termed polarization-sensitive interferometric synthetic aperture microscopy (PS-ISAM). This technique is the first functionalization of the ISAM method and provides improved depth-of-field for polarization-sensitive imaging. The basic assumptions of polarization-sensitive imaging are explored, and refocusing of birefringent structures is experimentally demonstrated. PS-ISAM enables high-resolution volumetric imaging of birefringent materials and tissue.
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