Abstract:It remains a tough task for designing a microscopy system to approach the diffraction limit over a wide field of view due to its restricted space bandwidth product (SBP). Fourier ptychographic microscopy (FPM) has been developed to broaden the SBP of a conventional microscope platform without major hardware modifications. In this paper, we propose a novel FPM system based on the phase-coded speckle illumination, termed PSI-FPM, which employs a laser source with a speckle illumination control optical system. A phase-only spatial light modulator (SLM) with a condenser lens is utilized in the PSI-FPM system to project the phase-coded speckle illumination patterns onto the sample. The convolution between the sample spectrum and the illumination spectrum in the Fourier domain extend the numerical aperture of the objective that acts as a low-pass filter with cut-off frequency. The SLM is introduced in the PSI-FPM system to produce the specific illumination patterns so that the number of the captured images used for reconstruction are greatly reduced. In addition, the generated pattern is scanned to different directions without mechanical movement, which improves the robustness of the system. The PSI-FPM system is validated against simulations and experiments, and as a result reconstructs high-resolution images once the phase retrieval algorithm is employed. We envision that the PSI-FPM system will be suitable for many other speckle imaging applications.

Effects of Polarization and Phase Modulation on the Focal Spot in 4pi Microscopy

Polarization effects in 4Pi microscopy

Effects of polarization on the de-excitation dark focal spot in STED microscopy

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Sharper Fluorescent Super-Resolution Spot Generated by Azimuthally Polarized Beam in STED Microscopy

Phase encoding for sharper focus of the azimuthally polarized beam.

Sharper Focal Spot below Λ/4 of Azimuthally Polarized Illumination Phase-Encoded by the Binary 0/π Phase Plate

3D Point Scanning Super-Resolution Microscopy Via Polarization Modulation.

Frequency-shifting confocal microscopy via azimuthally polarized Bessel-Gaussian beam

A Method for Achieving Multiple Foci with Subdiffraction Resolution along the Axial Direction

Fluorescence Emission Difference Microscopy Based on Polarization Modulation

A Method for Generating A Three-Dimensional Dark Spot Using A Radially Polarized Beam

Enhancing the performance of fluorescence emission difference microscopy using beam modulation

Review of 4pi Fluorescence Nanoscopy

Numerical Studies of Focal Modulation Microscopy in High-Na System.

Resolution and Contrast Enhancements of Optical Microscope Based on Point Spread Function Engineering

Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Polarized Fluorescence Microscopy and Recent Progress(Invited)

Methods for generating a dark spot using phase and polarization modulation light

The Effect of Polarization Light on Optical Imaging System

Aberrations in 4pi Microscopy