Aberrations in 4pi Microscopy

Xiang Hao,Jacopo Antonello,Edward S. Allgeyer,Joerg Bewersdorf,Martin J. Booth
DOI: https://doi.org/10.1364/oe.25.014049
IF: 3.8
2017-01-01
Optics Express
Abstract:The combination of two opposing objective lenses in 4Pi fluorescence microscopy significantly improves the axial resolution and increases the collection efficiency. Combining 4Pi microscopy with other super-resolution techniques has resulted in the highest three-dimensional (3D) resolution in fluorescence microscopy to date. It has previously been shown that the performance of 4Pi microscopy is significantly affected by aberrations. However, a comprehensive description of 4Pi microscope aberrations has been missing. In this paper, we introduce an approach to describe aberrations in a 4Pi cavity through a new functional representation. We discuss the focusing properties of 4Pi systems affected by aberrations and discuss the implications for adaptive optics schemes for 4Pi microscopes based on this new insight.
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