Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technology, which can bypass the limitation of optical-spatial-bandwidth product to achieve imaging with both high resolution and wide field-of-view. Original FPM setup is limited to image thin samples with angle-varied illuminations. A diffuser scanning FPM method, which scans a diffuser with unknown profile between the object and objective lens to modulate the complex exit wavefront of the object, is implemented to address this 3D refocusing problem. However, since the profile of the diffuser is unknown, the number of images required for method to converge is large. A mechanical translation stage is also required, which may introduce the systematic error of the position. In this paper, we propose a new FPM method with wavefront modulation imposed by spatial light modulator (SLM). The SLM is placed between the object and the objective lens to produce specific pattern profile, which is used to modulate the complex exit wavefront of the object. Fourier ptychographic phase retrieval process is employed to recovery the complex exit wavefront of the object. With the use of SLM, it is unnecessary to employ 2D motorized translation stage to move the imposed pattern profile so that the error of translation stage is eliminated. Moreover, since the imposed pattern profile is known, the number of images required for the algorithm to converge is reduced. Simulation and experiment are performed to validate the effectiveness of our proposed method. Compared with the method, which utilizes unknown diffuser, our method can achieve a more accurate reconstruction result with a faster data acquisition and higher convergence speed.

Background Suppression Structured Illumination Microscopy Based on Polarization Modulation

Speckle-free Laser Projection Structured Illumination Microscopy Based on a Digital Micromirror Device

3D Point Scanning Super-Resolution Microscopy Via Polarization Modulation.

Widefield and total internal reflection fluorescent structured illumination microscopy with scanning galvo mirrors.

Real-time reconstruction using electro-optics modulator-based structured illumination microscopy

Dual-color Simultaneous Structured Illumination Microscopy Based on Galvo-Mirrors

Structured Illumination Microscopy with Modified Joint Richardson-Lucy Deconvolution

Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Light Sheet Microscopy with High Spatial Resolution Based on Polarized Structured Illumination Beam Modulated by the Phase Mask

Laser scanning saturated structured illumination microscopy based on phase modulation

Enhanced Reconstruction of Structured Illumination Microscopy on a Polarized Specimen

Super-resolution Imaging of Fluorescent Dipoles by Polarized Structured Illumination Microscopy

High-speed Auto-Polarization Synchronization Modulation Three-dimensional Structured Illumination Microscopy

Wavefront Modulation with Spatial Light Modulator for Fourier Ptychographic Microscopy

3D Super-Resolution Microscopy Based on Nonlinear Gradient Descent Structured Illumination.

Super-resolution imaging of fluorescent dipoles via polarized structured illumination microscopy

SIM Reconstruction Framework for High-Speed Multi-Dimensional Super-Resolution Imaging

Super-resolution Imaging of the Fluorescent Dipole Assembly with Polarized Structured Illumination Microscopy

Structured Illumination in Spatial-Orientational Hyperspace

Fast, Accurate Polarization and Polarity Imaging with Polarized Structured Illumination

Fluorescence Emission Difference Microscopy Based on Polarization Modulation