Abstract:There is an ever increasing interest in the development of plasmonic 2D nanomaterials, with widespread applications in optoelectronics, high resolution microscopy, imaging and sensing, among others. With the current ability of ultrathin noble metal film deposition down to a few monolayers in thickness, there is a need for an analytical expression of the thickness dependent complex dielectric function for predicting optical properties for arbitrary thicknesses. The free and bound electron contributions to the dielectric function are dealt with independently, since their influences affect separate wavelengths ranges. The former is dealt within the Drude model framework for large wavelengths with appropriately addressed damping constant and plasma frequency parameters to account for thickness dependence. Applying our previously developed method, we determine these parameters for specific film thicknesses, based on refractive index experimental values for Ag and Au thin films. Fitting separately each one of these parameters allowed us to find an analytical expression for their dependence on arbitrary film thickness and consequently for the free electron contribution. Concerning bound electrons, it is seen that its contribution for small wavelengths is the same for all analyzed thicknesses and may be set equal to the bulk bound contribution. Taking all these facts into account, the complex dielectric function can be rewritten analytically, in terms of the bulk dielectric function plus corrective film thickness dependent terms. In particular, the fitting process for the damping constant allows us to determine that the electron scattering at the film boundary is mainly diffusive (inelastic) for both silver and gold thin films. It is also shown that, in accordance with theoretical studies, plasma frequency shows a red shift as the film thickness decreases.

Thickness Dispersion of Surface Plasmon of Ag Nano-Thin Films: Determination by Ellipsometry Iterated with Transmittance Method.

Thickness Dependence of Surface Plasmon Damping and Dispersion in Ultrathin Ag Films

Determination of the optical constants of polymer light-emitting diode films from single reflection measurements

A New Method for Determination of the Optical Constants and Thickness of Thin Film

Spatial Dispersion of Optical Thin Films

Determination of optical constants and thickness of photoactive layer in polymer oslar cells by single transmission measurement

Localized Surface Plasmon Enhanced Photoluminescence from Zno Films: Extraction Direction and Emitting Layer Thickness

Thickness Dependence of the Surface Plasmon Dispersion in Ultrathin Aluminum Films on Silicon

Determination of Thickness-dependent Damping Constant and Plasma Frequency for Ultrathin Ag and Au Films: Nanoscale Dielectric Function

Permittivity Acquisition Of Plasmonic Materials At Epsilon Near Zero Wavelengths

Plasmon thermal conductivity of thin Au and Ag films

Determination of the Optical Constants of Solar-Control Amorphous Silicon Thin Films on Float Glass

A method to extract absorption coefficient of thin films from transmission spectra of the films on thick substrates

Thickness and microstructure effects in the optical and electrical properties of silver thin films

Characterization Of Thin Absorbing Films Using Infrared Surface-Plasmons

Surface Plasmon Dispersion of A Cluster-Assembled Silver Nanoparticle Film

A Research of Thickness Measurement of Nano-Porous Alumina Films Based on Reflection Spectrum

A fully automatized method for the unambiguous wavelength-by-wavelength determination of the thickness and optical property of a very thin film with a transparent range

Broadband Surface Plasmon Resonance Spectroscopy for Determination of Refractive-Index Dispersion of Dielectric Thin Films

The Medium-Related Optical Constants of Noble Metals Observed by Ellipsometric Study

Single Crystalline Silver Films for Plasmonics: From Monolayer to Optically Thick Film