Abstract:The field of local conductivity measurement has produced many kinds of scanning probes to measure the electricalcharacteristics at the nanoscale. However, due to the design limitations, no appropriate probe has been developed to measureand simultaneously image the electrical characteristics at 100 nm order. This research aims to fabricate a four-pOint AFMprobe in order to image electrical characteristics at 100 nm ord Four-point atomic force microscope probe for imaging the electrical characteristics of materials Lin ZHANG", Yang JU*2 and Atsushi HOSOI*2 *1Nagoya Univ. Dept. of Mechanical science and Engineering Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan The field of local conductivity measurement has produced many kinds of scanning probes to measure the electrical characteristics at the nanoscale. However, due to the design limitations, no appropriate probe has been developed to measure and simultaneously image the electrical characteristics at 100 nm order. This research aims to fabricate a four-point AFM probe in order to image electrical characteristics at 100 nm order. Specifically, a certain tape of AFM probe for cell measurement e.g . Biolever, can be etched into four independent electrodes with an in-between space of 200 nm. The four electrodes are basically used to measure the electrical potential drop by allowing the electric current to pass through. The four-point probe is then integrated into a multimode AFM to realize the scanning and imaging simultaneously. The present experimental results show that the four-point probe fabricated can be used to image the surface topography of the Au nanowire, thereby permitting the simultaneous measurements of surface profiles and electrical characteristics of the samples at the next stage.

Direct Measurement of Electrostatic Fields Using Single Teflon Nanoparticle Attached to AFM Tip

Direct Measurement of Electrostatic Fields Within the Zernike Electrostatic Phase Plate Using Single 155 Nm Teflon Nanoparticle Attached to the Pillar-Shaped Atomic Force Microscope Tip

Quantitative Measurement of Local Conductivity of SnO2 Nanobelt Field Effect Transistor Utilizing Microwave Atomic Force Microscopy

Development of a New Microscopic Four-Point AFM Probe for the Measurement of Local Electrical Conductivity

Quantitative Measurement of Submicrometre Electrical Conductivity

Microscopic Four-Point Atomic Force Microscope Probe Technique for Local Electrical Conductivity Measurement

J0610104 Evaluation of Interatomic Force on the Tip of Probe by Using Microwave Atomic Force Microscope

Measurement of Local Electrical Conductivity by Four-Point Probe Atomic Force Microscope Technique

Simple and Fast Method to Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

A Methodology for Quantitative Evaluation of Local Electrical Conductivity: from Micron to Submicron

NOVEL AFM PROBE FOR LOCAL CONDUCTIVITY MEASUREMENT

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

G030083 Four-point Atomic Force Microscope Probe for Imaging the Electrica1 Characteristics of Materials

Scanning triboelectric nanogenerator as a nanoscale probe for measuring local surface charge density on a dielectric film

High-resolution surface charge image achieved by a multiforce sensor based on a quartz tuning fork in electrostatic force microscope

Characterization of Single 1.8-Nm Au Nanoparticle Attachments on AFM Tips for Single Sub-4-nm Object Pickup

Single charge regime electrodynamic force measuring in solution by upconversion photonic force microscope

Quantitative Noncontact Electrostatic Force Imaging of Nanocrystal Polarizability

Direct measurement of periodic electric forces in liquids

Direct measurement of short-range forces with a levitated nanoparticle

Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy