Low-loss Si3N4 Arrayed-Waveguide Grating (de)multiplexer Using Nano-Core Optical Waveguides.

Daoxin Dai,Zhi Wang,Jared F. Bauters,M. -C. Tien,Martijn J. R. Heck,Daniel J. Blumenthal,John E. Bowers
DOI: https://doi.org/10.1364/oe.19.014130
IF: 3.8
2011-01-01
Optics Express
Abstract:A 16-channel 200 GHz arrayed-waveguide grating (AWG) (de)-multiplexer is demonstrated experimentally by utilizing Si3N4 buried optical waveguides, which have 50 nm-thick Si3N4 cores and a 15 μm-thick SiO2 cladding. The structure with an ultra-thin core layer helps to reduce the scattering due to the sidewall roughness and consequently shows very low loss of about 0.4~0.8 dB/m. When using this type of optical waveguide for an AWG (de)multiplexer, there is no problem associated with gap refill using the upper-cladding material even when choosing a small (e.g., 1.0 μm) gap between adjacent arrayed waveguides, which helps to reduce the transition loss between the FPR (free-propagation region) and the arrayed waveguides. Therefore, the demonstrated AWG (de)multiplexer based on the present Si3N4 buried optical waveguides has a low on-chip loss. The fabricated AWG (de)multiplexer is characterized in two wavelength ranges around 1310 nm and 1550 nm, respectively. It shows that the crosstalk from adjacent and non-adjacent channels are about -30 dB, and -40 dB, respectively, at the wavelength range of 1310 nm. The Si3N4 AWG (de)multiplexer has a temperature dependence of about 0.011 nm/°C, which is close to that of a pure SiO2 AWG device.
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