A Sideband Interrogation Method for Precise Measurement of Resonance Frequency Difference Between Interferometers

Qingwen Liu,Tokunaga, T.,Zuyuan He
DOI: https://doi.org/10.1364/ofc.2012.otu1c.1
2012-01-01
Abstract:A novel sideband interrogation method was developed for precise measurement of resonance frequency difference between interferometers. Frequency resolution better than 29 kHz was experimentally demonstrated with a pair of fiber Fabry-Perot interferometers.
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