Abstract:Industries need a better understanding of the materials to shorten design time. The accurate measurement can provide valuable information to properly use the material for solid design or monitoring processes. Every material has a unique electrical characteristic that depends on its dielectric properties. This paper presents the free-space measurements to determine the dielectric properties of the material under test. The main objective was to measure the dielectric properties of different materials at microwave frequencies. The frequency range in this measurement setup is 8–12 GHz (X band). The measurement setup includes a Vector Network Analyzer, horn antennas, calibration kit, and simulation software to determine the dielectric properties of the material under test. In this work, the transmission coefficient (S-parameter) was measured to obtain the amplitude and phase of the material under test. This study developed an extraction procedure by finite element simulation. The measurement setup was remodeled in the HFSS simulation according to all parameters used in the measurement setup settings. Simulations are used to extract the dielectric properties of the material under test from measurement results. The extraction result was tabulated and compared with the other references.

High Frequency Permittivity Determination by Spectra Simulation and Measurement of Microstrip Ring Resonators

Combining FDTD Simulations with Measurements of Microstrip Ring Resonators for Characterization of Low‐ and High‐k Dielectrics at Microwaves

A Broadband Permeability Measurement of Fetan Lamination Stack by the Shorted Microstrip Line Method

Modeling of Microwave Ring Resonators Using the Finite-Difference Time-Domain Method (Fdtd)

Study on tunable periodic graphene split-ring resonator (GSRR) structures using FDTD method

A High-Efficiency Measurement System For The Complex Permittivity Characterization Of Materials At Uhf Band

A Method to Determine Broadband Complex Permittivity of Thin Film Dielectric Materials up to 60 GHz

Non-contact measurement of complex permittivity based on coupled magnetic and electric resonances

Analysis of Resonance Processes in Microstrip Ring Resonators by the FDTD Method

Attenuation Measurement of the Dielectric Rod Using Parallel Strips with a Resonable Field Environment

Efficient Determination of Resonance Frequencies in Resonant Structures Using the Fdtd Method

Measurement for Complex Permittivity of Specific Structure

A complex permittivity measurement technique for high dielectric constant materials at microwave frequency

Dielectric Constant Determination for Thin Film by Using Reflection Resonance Microstrip Line Method

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

FDTD Study of Resonance Processes in Microstrip Ring Resonators with Different Excitation Geometries

Analysis of broadband microwave conductivity and permittivity measurements of semiconducting materials

A new perturbation method for determining the broadband complex permeability of magnetic thin films

Dielectric Characterization of RF-Printed Circuit Board Materials by Microstrip Transmission Lines and Conductor-Backed Coplanar Waveguides Up to 110 GHz

Free-Space Method for Measurement of Dielectric Properties at Microwave Frequencies

Resonant Frequency of a Rectangular Patch Sensor Covered with Multilayered Dielectric Structures