Design of Sub-50 Nm Ultrathin-Body (UTB) SOI MOSFETs with Raised S/D

XS Wu,SD Zhang,M Chan,P Chan
DOI: https://doi.org/10.1109/edssc.2003.1283525
2003-01-01
Abstract:This paper gives a general analysis on source/drain series resistance and parasitic capacitance of sub-50 nm UTB SOI MOSFETs with raised S/D through 2-D simulations. RC-delay tradeoff introduced from the use of UTB and raised S/D is studied and the result is presented. The combination with the use of low-K dielectric and sunk S/D structure are proposed to further reduce the serious and gate-to-drain capacitance while without degrading other device performance parameters. The advantages of the proposed structure is verified by 2D device simulation.
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