Laser Probe System for 5 GHz SAW/BAW Devices

Ken-ya Hashimoto,Shuntaro Kawachi,Akira Takahashi,Shinya Sakamoto,Tatsuya Omori
DOI: https://doi.org/10.1109/fcs.2014.6859929
2014-01-01
Abstract:In 2008, the authors reported development of a type of the laser probe system based on the Sagnac interferometer for the diagnosis of radio frequency (RF) surface and bulk acoustic wave (SAW/BAW) devices. This paper describes extension of its maximum operation frequency to the low SHF (several GHz) range without performance degradation. First, electronic components used in the system were re-examined, and some of them were replaced with appropriate ones. Second, a miniature wafer probing system was newly developed for the operation under a high magnification (x100) lens with a tiny working distance (similar to 3.4 mm). This enables us to avoid wire-bonding between a device under the test and a printed circuit board; wire inductance gives large impact to the device characteristic in the GHz range. RF SAW/BAW devices operating in 5 GHz were characterized by the laser probe, and its effectiveness was demonstrated.
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