NIO: A fast and accurate verification method for PVT variations

Minghua Li,Dian Zhou,Xuan Zeng
DOI: https://doi.org/10.1109/ICSICT.2014.7021608
2014-01-01
Abstract:In the Integrated Circuit (IC) design, sources of variations are composed of Process variation (P), Supply voltage (V), and Operation Temperature (T). These factors are normally combined and modeled as PVT corners. In today's designs, up to hundreds or even thousands PVT corners are needed. This paper proposed a Nested Iterative Optimization (NIO) method to fast and accurate extracts worst-case of PVT corners. An average 21× speedup is achieved.
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