Abstract:Our recent investigations and understanding of the negative bias temperature instability (NBTI) degradation in p-MOSFETs with ultrathin SiON gate dielectric are reviewed. The progressive understanding of NBTI mechanism is mainly related to the novel measurement techniques we developed. We show in this paper the following: 1) For the conventional charge pumping and direct-current current-voltage interface trap measurement, the interface trap density Nit is underestimated due to the recovery during measurement delay. The existing Nit data should be reexamined; 2) an ultrafast pulsed I-V method [fast pulsed measurement (FPM)] is developed to measure DeltaVth with measurement time tM = 100 ns. It can be considered as free from recovery during measurement; 3) due to the degradation during the initial threshold voltage measurement, the existing slow on-the-fly (OTF) DeltaVth measurement distorts (overestimates) the slope and induces a kink at early stress time in the Log-Log curve of the time evolution of NBTI degradation. A fast OTF DeltaVth measurement method is developed to overcome this problem; 4) a novel OTF interface trap (OFIT) measurement method is developed which is free from interface trap recovery during measurement. The OFIT measurement provides the most reliable data to inspect the interface trap R-D model; 5) combining the OFIT and FPM measurements, we decompose the NBTI DeltaVth into two components: A slow DeltaVth it component contributed by with a slow recovery time longer than 50mus and a fast DeltaVth ox component contributed by DeltaVox with a broad spectrum of recovery time, including a component with very fast recovery time (100 ns); and 6) the dynamic degradation by DeltaVth it component is frequency-independent and can be measured by a dc method, whereas the dynamic degradation DeltaVth ox by component measured by FPM is increased by increasing frequency. The ten-year lifetime of the p-MOSFETs is mainly determined by the degradation of the DeltaVth it component.

NBTI degradation in STI-based LDMOSFETs.

Understanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique

Insights into Stress-Induced Degradation of STI-based LDMOSFETs by MR-DCIV Spectroscopy

Investigation on Hot-Carrier-induced Degradation of SOI NLIGBT.

Research of Hot-carrier-induced Degradation on SOI NLIGBT

Understanding of HCI degradation temperature dependence in SOI STI-pLDMOSFETs from MR-DCIV spectroscopy

Studies of NBTI in Pmosfets with Thermal and Plasma Nitrided SiON Gate Oxides by OFIT and FPM Methods

Understand NBTI Mechanism by Developing Novel Measurement Techniques

Issues And Controversies In Nbti Degradation And Recovery Mechanisms For P-Mosfets With Sion Gate Dielectrics

Investigations of Nbti by Conventional and New Measurement Methods for P-Mosfets

Correlation Between MR-DCIV Current and High-Voltage-stress-induced Degradation in LDMOSFETs

Understanding of Self-Heating Enhanced Degradation in Pldmosfets by MR-DCIV Method

High temperature behavior of multi-region direct current current–voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal–oxide–semiconductor field-effect-transistors reliability

New Insights of Bti Degradation in Mosfets with Sion Gate Dielectrics

Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise.

Experimental insights on the degradation and recovery of pMOSFET under non-uniform NBTI stresses

Evaluation of MOS Interface Trap Generation after BTI Stress Using Flicker Noise

PBTI and HCI Degradations of Ultrathin Body InGaAs-On-Insulator Nmosfets Fabricated by Wafer Bonding

Model of NBTI combined with mobility degradation

NBTI-related issues in deep submicron pMOSFETs

Multi-Region Dciv Spectroscopy and Impacts on the Design of Sti-Based Ldmosfets