Low cycle fatigue performance of ball grid array structure Cu/Sn–3.0Ag–0.5Cu/Cu solder joints

H.B. Qin,W.Y. Li,M.B. Zhou,X.P. Zhang
DOI: https://doi.org/10.1016/j.microrel.2014.07.052
IF: 1.6
2014-01-01
Microelectronics Reliability
Abstract:•A plastic strain energy density (PSED) method is used to develop fatigue life model of BGA joints.•A fatigue life prediction model based on PSED is proposed to evaluate fatigue life of BGA joints.•Fatigue crack growth depends strongly on stress triaxiality relating to joint geometry and load mode.•The model prevents effect of plastic strain energy concentration on joint fatigue life prediction.
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