Structural Characterization of La0.9ba0.1mno3/Y-Zro2 Film by X-Ray Diffraction

W. S. Tan,H. O. Wang,P. Dai,H. P. Wu,X. S. Wu,Q. J. Jia,G. J. Hu,J. Gao
DOI: https://doi.org/10.1016/j.physb.2011.08.005
2011-01-01
Abstract:Perovskite manganite La0.9Ba0.1MnO3(LBMO) films were deposited on (001)-oriented single crystal yttria-stabilized zirconia (YSZ) substrate by 90° off-axis radio frequency magnetron sputtering. The film thickness ranged from 10nm to 100nm. Grazing incidence X-ray diffraction technique and high resolution X-ray diffraction were applied to characterize the structure of LBMO films. The LBMO film mainly consisted of (001)-orientated grain as well as weakly textured (110)-orientated grain. The results indicated that an amorphous layer with thickness of about 4nm was formed at the LBMO/YSZ interface. The strain in LBMO film was small and averaged to be about –0.14%. The strain in the film was not lattice mismatch-induced strain but residual strain due to the difference in thermal expansion coefficient between film and substrate.
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