Effects of Substrate-Target Distance and Si Co-Doping on the Properties of Al-Doped Zno Films Deposited by Magnetron Sputtering

Xu Hao,Lu Fang,Fu Zheng-Wen
DOI: https://doi.org/10.3866/pku.whxb20110422
2011-01-01
Acta Physico-Chimica Sinica
Abstract:Transparent conductive Al-doped ZnO (AZO) and Si-codoped AZO (AZO: Si) films were deposited on square quartz substrates by radio frequency (RF) magnetron sputtering. The effect of distance between the substrate and target (D-st) and the effect of co-doping Si on the electrical and optical properties of the AZO films were systematically investigated. The resistivity, carrier concentration, and mobility were found to be strongly dependent on the D-st values. With a decrease in D-st, the carrier concentration and mobility increased significantly, which resulted in improved conductivity. The lowest resistivity of 4.94x10(-4) Omega.cm was obtained at a D-st of 4.5 cm, and this was associated with a carrier concentration of 3.75 x 10(20) cm(-3) and a mobility of 33.7 cm2 . V-1 . s(-1). X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) spectroscopy, and grain boundary scattering models were used to analyze the relationship between the carrier concentration and the mobility at different deposition (D-st) values. Transmittance spectra showed an average transmittance of >93% in the visible-near infrared range for all the samples and a blue shift of the absorption edge with a decrease in D-st. AZO:Si films had high-conductance and high-transmittance optical properties compared with AZO films, and they had better resistivity stability than the AZO films when exposed to a hot and damp atmosphere, which is practically meaningful.
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