Preparation and Characterization of Nio@Sio2@Tio2 Coaxial Trilayered Nanocables

Song Chao,Dong Xiangting,Wang Jinxian,Liu Guixia
2011-01-01
Abstract:NiO@SiO2@TiO2 coaxial trilayered nanocables were successfully fabricated through modified electrospinning equipment via electrospinning technique. The samples were characterized by thermogravimetric-differential thermal analysis (TG-DTA), X-ray diffractometry (XRD), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Results showed that the obtained products are NiO@SiO2@TiO2 coaxial trilayered nanocables. The core layer is NiO, and its diameter is ca. 40 similar to 50 nm. The middle layer is SiO2, and its thickness is ca. 40-45 nm. The outer layer is TiO2 and the thickness is about 45 similar to 50 nm. Formation mechanism of NiO@SiO2@TiO2 coaxial trilayered nanocables was preliminarily proposed.
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