New method for the measurement and simulation on the characteristics of two-dimensional electron multipliers

Rong Xiang,Li Chen,Ye Li,Kui Wu,Delong Jiang,Xin Wang,Jingquan Tian
2010-01-01
Abstract:The structural principle of UV photoelectric method for the measurement of the multiplied characteristics of two dimensional electron multipliers and the simulation of the dynamic characteristics of the image-tube were given in this paper. It was shown that the choice of surface electron source with a uniform current density is the key point. Using this method, the electron gain and the transmission characteristic of the MCP (or the MCP with an ion barrier film) were measured. The relationship between the dead-voltage and the thickness of the ion barrier film and it's applications were given. For the first time, the concept of "equivalent cathode" was proposed. The test principle of UV excitation method for double MCP performance was shown in detail; in this method, the obtained electron emission from MCP1excited by the UV source replaced that electrons from Au thin film, and using these electron emissions to measure the performance of another MCP2. The application prospect of this method on the measurement of the ions transmission and stopping characteristic though the ion barrier film were shown.
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