Effect of Sputtering Parameters on Film Composition, Crystal Structure, and Coercivity of SmCo Based Films Deposited on Si (100) Substrates

XUE Gang,PENG Long,ZHANG Huai-Wu
DOI: https://doi.org/10.1088/0256-307x/27/1/017501
2010-01-01
Chinese Physics Letters
Abstract:The sputtering parameter mediated composition (SPMC) effect of 3.0-μm-thick SmCo-based films is experimentally and theoretically studied. The experimental results give a clear indication that the Sm concentration increases with the decreasing sputtering power or with the increasing Ar gas pressure, which are in agreement with the calculated values when the preferential sputtering effect is disregarded. The SPMC effect provides an opportunity for the same composite target to fabricate films with an Sm concentration varying from 13.8at.% to 17.3at.%, which is reasonable for the magnetic phase transformation (Sm2Co17→SmCo7→SmCo5) and the enhanced coercivity.
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