Properties and Structure of High Coercivity Sm(Co, Al, Si)/Cr Sputtered Thin Films

X Wang,DC Zhang,ZY Li
DOI: https://doi.org/10.1515/ijnsns.2002.3.3-4.661
2002-01-01
International Journal of Nonlinear Sciences and Numerical Simulation
Abstract:Sm(Co, Al, Si)/Cr films have been prepared as one kind of promising materials. The interface exists a few of nanocrystalline grains, whereas other area is amorphous in the as-deposited state. After subsequent heat treatment, the amorphous phase around the position corresponding to the SmCo2Al2.8Si0.2 (10 (1) over bar 1) line starts to evolve into a broad nanocrystalline peak. The optimal value of thickness for Cr underlayer and Sm(Co, Al, Si) film, Sm content, etc results in high coercivity H-c. After being annealed at 500 degreesC for 25 min, the optimal value of coercivity H-c (up to 1042 kA/m) and squareness ratio S (0.9similar to1) has been obtained. The lattice matching of SMCo(2)l(2.8)Si(0.2) Sm(Co, Al, Si)(5) {10 (1) over bar 1} and Cr{110}, {1 1 (2) over bar0} and {200},etc. has been found at the different conditions, The conclusion of H-c,H-SmCoAlSi>H-c,H-SmCo has also been gotten.
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