Band Offsets of Al2O3/InxGa1−xAs (x=0.53 and 0.75) and the Effects of Postdeposition Annealing

N. V. Nguyen,M. Xu,O. A. Kirillov,P. D. Ye,C. Wang,K. Cheung,J. S. Suehle
DOI: https://doi.org/10.1063/1.3306732
IF: 4
2010-01-01
Applied Physics Letters
Abstract:Band offsets at the interfaces of InxGa1−xAs/Al2O3/Al where x=0.53 and 0.75 were determined by internal photoemission and spectroscopic ellipsometry. The photoemission energy threshold at the InxGa1−xAs/Al2O3 interface was found to be insensitive to the indium composition but shifted to a lower energy after a postdeposition annealing at high temperatures. Subthreshold electron photoemission was also observed for the annealed sample and was attributed to interfacial layer formation during the annealing process.
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