Microwave dielectric properties and Raman spectroscopy of Scheelite solid solution [(Li0.5Bi0.5)1-xCax] MoO4 ceramics with ultra-low sintering temperatures

Di Zhou,Hongbin Wang,Qiuping Wang,XinGuang Wu,Jing Guo,Gaoqun Zhang,Li Shui,Xi Yao,Clive A. Randall,Lixia Pang,Hanchen Liu
DOI: https://doi.org/10.1142/S1793604710001354
IF: 1.4901
2011-01-01
Functional Materials Letters
Abstract:A Scheelite solid solution was formed based on [(Li0.5Bi0.5)(1-x)Ca-x]MoO4 ceramics and prepared via a solid state reaction method in the range 0.0 <= x <= 1.0. High performance microwave dielectric properties were obtained in the [(Li0.5Bi0.5)(0.15)Ca-0.85]MoO4 ceramic sintered at 760 degrees C with a relative permittivity of 14.1, a Qf value of 24,000GHz (at 10.0GHz), and a temperature coefficient value of +10.7 ppm/degrees C and the [(Li0.5Bi0.5)(0.1)Ca-0.9]MoO4 ceramic sintered at 850 degrees C with a relative permittivity of 12.7, a Qf value of 41,300GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/degrees C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.
What problem does this paper attempt to address?