Two-axis scanning micromirror based on a tilt-and-lateral shift-free piezoelectric actuator

Wenjing Liu,Yiping Zhu,Jiping Li,A. S. Virendrapal,Yongming Tang,Baoping Wang,Huikai Xie
DOI: https://doi.org/10.1109/ICSENS.2010.5690601
2010-01-01
Abstract:This paper presents a 2-axis scanning piezoelectric micromirror with zero initial tilt and no lateral shift during scanning. The piezoelectric material is a sol-gel PZT with a Zr/Ti ratio of 53/47. The unimorph PZT actuation beams consist of Pt/Ti/PZT/Pt/Ti/SiO2 thin-film layers, which are released via undercutting the substrate silicon. Two-dimensional scans with a 4.8° scan range have been demonstrated at 2 V at 635 Hz (resonance).
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