Abstract:Metal-film dielectric capacitors provide lump portions of energy on demand. While the capacities of various capacitor designs are comparable in magnitude, their stabilities make a difference. Dielectric breakdowns - micro-discharges - routinely occur in capacitors due to the inevitable presence of localized structure defects. The application of polymeric dielectric materials featuring flexible structures helps obtain more uniform insulating layers. At the modern technological level, it is impossible to completely avoid micro-discharges upon device exploitation. Every micro-discharge results in the formation of a soot channel, which is empirically known to exhibit semiconductor behavior. Because of its capability to conduct electricity, the emerged soot channels harm the subsequent capacitor performance and decrease the amount of stored energy. The accumulation of the soot throughout a dielectric capacitor ultimately results in irreversible overall failure. In the context of the dielectric breakdown, self-healing designates a range of chemical processes, which spontaneously rearrange the atoms in the soot channels to partially return their insulative function. We developed a universal method capable of rating new capacitor designs including electrode and polymer material and their proportions. We found the best-performing designs produce abundant volatile by-products after micro-discharge, whereas the soot samples exhibit lower electronic conductivities. We proved the capability of the theoretical method to rate the empirical performance of the known capacitors. The method relies on various electronic-structure simulations and potential landscape explorations. The reported advance opens an impressive avenue to computationally probe thousands of hypothetical capacitor designs.

Calculation and Measurement of Metalized Film Capacitor's Inner Pressure and Its Influence on Self-Healing Characteristics

Theoretical and experimental studies on the self‐healing properties of metallised capacitor films under multiple stresses

Study on the Structure–Function Relationship Between Metallized Layer and Self-Healing Morphology in Metallized Film

Dynamic Process of Self-Healing in Metallized Film: from Experiment to Theoretical Model

Influence factors for the self-healing of metallized polypropylene capacitors

Study of the in situ test setup and analysis methods for self-healing properties of metallized film capacitors

Analysis of Conductor Loss in Interdigital Capacitor Based Measurement of Dielectric Constant of Ferroelectric Thin Film

Degradation Analysis and Failure Prediction of Aluminum Electrolytic Capacitors

The Influences of the Shaping Mould Design on the Performance of Capacitor and the Corresponding Countermeasure

Calculation of Electric Field in Safety Film Capacitors

An Investigation on the Evolution of Insulation Performance of BOPP Films for Power Capacitors under Multi Physical Fields Aging

Theoretical Connection from the Dielectric Constant of Films to the Capacitance of Capacitors under High Temperature

The Capacitance Loss Mechanism of Metallized Film Capacitor under Pulsed Discharge Condition

Study on Metallized Film Capacitor and Its Voltage Maintaining Performance

Calculation of Current Distribution Inside the Metallized Film Capacitor Element at High Frequency

Self-Healing in Dielectric Capacitors: a Universal Method to Computationally Rate Newly Introduced Energy Storage Designs

On the Failure Mechanism of Metallized Polypropylene Pulse Capacitors

Study on the Heat Dissipation Model and Simulation of Circular Element for DC-Link Capacitor

Self-Healing in Metallized Film Capacitors: Theory of Breakdown Interruption

A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications

Polyimide Films Impregnated with Epoxy Resin Demonstrating Superior Self-Healing Properties for Thermally Stable Energy Storage Capacitors